Engineering, Production & Testing
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Jul 16, 2010
Advanced Thermal Solutions' New iTHERM-100 System Enables Precise Air Flow and Temperature Testing
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Jul 16, 2010
Veeco Introduces Precision Optical Profiler for Automated HB-LED Production QA/Q

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Jul 16, 2010
EV Group Introduces Industry's First Fully Automated Wafer Bonding System for High-Brightness LED Manufacturing
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Jul 16, 2010
Labsphere’s LMS-3M Three Meter Lamp Measurement Sphere
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Jul 19, 2010
Count On Tools Offers Custom SMT Nozzles for CREE® LEDs
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Jul 19, 2010
New Ocean Optics Light-Measurement System Ideal for Analysis of LEDs, Lamps and More
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Jul 20, 2010
Gamma Scientific and Evolusys Technologies to Join in the Development of LED Test Equipment
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Jul 20, 2010
Ultratech Introduces Sapphire 100 Lithography System for HB-LED Manufacturing
Ultratech, Inc., a leading supplier of lithography and laser-processing systems used to manufacture semiconductor devices, today introduced its newest lithography system, the Sapphire 100 for high-brightness light-emitting diode (HBLED) manufacturing.
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Jul 20, 2010
Essemtec Introduces Simultaneous Through-Hole LEDs and SMD Placement
Essemtec introduces the CLM979 Radial Component Feeder that enables the assembly of through-hole LEDs on a standard pick-and-place machine. The feeder releases LEDs from the tape, cuts the wire ends and prepares the component for pickup.
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Jul 20, 2010
Orb Optronix Announces Its New Family of Advanced LED Measurement Systems

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Jul 20, 2010
Essemtec Improves Its Semiautomatic Printers
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Jul 20, 2010
Essemtec to Debut New Era at Productronica 2009
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Jul 19, 2010
Instrument Systems Announces New SpecWin Pro Analysis Software for Optical Spectrometers
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Jul 20, 2010
AIXTRON’s New Generation AIX G5 System Achieves Aggressive Productivity Targets
AIXTRON AG today announced that its next generation MOCVD Platform AIX G5 HT has demonstrated high quality GaN deposition at very high growth rates and high pressure above 600mbar and superior GaN/InGaN uniformities.
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Jul 20, 2010
New Ocean Optics Jaz Light-Measurement System for Analysis of LEDs and More
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Jul 20, 2010
Veeco Launches Lowest Cost of Ownership GaN MOCVD System
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Jul 20, 2010
New Product Enables Higher Quality LED and MEMS Products with Improved Manufacturing Efficiency
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Jul 21, 2010
Convection Oven RO300FC for Aluminium Cores
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Jul 22, 2010
New integrating Sphere for Testing High-Power LED Modules and SSL Light Sources
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Jul 22, 2010
New Series of New Developed Reflow- and Curing Ovens RO-VARIO from Essemtec
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