The measured analysis is about 10-20 μs per μLED and a few minutes or even seconds for the entire wafer.

Speed is a fundamental requirement for μLED wafer testing, since millions of μLEDs must be tested. Using traditional testing methods with integrating spheres, testing times may no longer be economical. A very fast alternative test option is parallel testing using 2D imaging light measurement devices, especially when spectral accuracy is maintained by referencing to a traceable spectroradiometer. In this paper, Instrument Systems shows experimental data demonstrating the ultra-fast speed of μLED quality tests using the LumiTop system: a 2D imaging light measurement device combined with a highly accurate reference spectroradiometer of the CAS series.

Two test cases were examined, photoluminescence of a μLED wafer and electroluminescence of a complete μOLED microdisplay. The analysis algorithms of the LumiTop system provide spectral and spatial data for each individual emitter. The measured analysis speed is about 10-20μs per μLED, bringing the testing speed of an entire wafer with millions of μLEDs down to a few minutes or even seconds.

White Paper Content:

• Challenges of the emerging μLED display technology
• Spectrally enhanced color calibration of the camera image
• Wafer-level characterization by photoluminescence imaging
• Microdisplay characterization by electroluminescens measurements
• Conclusions

Download the WHITE PAPER
"LumiTop System Enables Rapid Testing
of μLEDs"

by Dr. Tobias STEINEL, Instrument Systems

White Paper Issue: Rev. 1.0 / Published June 2023 / Pages: 6

Provided by Instrument Systems
White Paper Sponsor

www.instrumentsystems.com

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